VALUE ADDED TESTING

Product can be supplied to the standard MIL / STX and STXV Levels - as listed below, or to your custom requirements as outlined within our Value Added Services, and Quality Assurance Levels.

TEST DESCRIPTION

QUALITY ASSURANCE LEVELS

MIL

STX

STXV

INTERNAL VISUAL (PRE-CAP) INSPECTION

✔

TEMPERATURE CYCLING

(Method 1051

Condition G 10 cycles)

✔

CONSTANT ACCELERATION for wire bond devices(Method 2006 10k G's Y1 Axis only)

✔

PRE-BURN IN ELECTRICAL TEST

✔

HIGH TEMPERATURE REVERSE BIAS (Burn-in)

Transistors = Method 1039 Cond. A

FETS = Method 1042 Cond. B

Diodes = Method 1038 Cond. A

SCR's = Method 1040

✔

FINAL ELECTRICAL PARAMETER (DC-100%)

✔

HERMETIC SEAL(FINE & GROSS LEAK) for Cavity Devices (Method 1071)

✔

Group A(Static Parameters @25°C)

✔

Group B Solderability Without Aging (Method 2026)

✔

Group B Resistance to Solvents (Method 1022)

✔