Semitronics

VALUE ADDED TESTING

Product can be supplied to the standard MIL / STX and STXV Levels - as listed below, or to your custom requirements as outlined within our Value Added Services, and Quality Assurance Levels.

TEST DESCRIPTION QUALITY ASSURANCE LEVELS
MIL STX STXV
INTERNAL VISUAL (PRE-CAP) INSPECTION
TEMPERATURE CYCLING
(Method 1051
Condition G 10 cycles)
CONSTANT ACCELERATION for wire bond devices(Method 2006 10k G's Y1 Axis only)
PRE-BURN IN ELECTRICAL TEST
HIGH TEMPERATURE REVERSE BIAS (Burn-in)
Transistors = Method 1039 Cond. A
FETS = Method 1042 Cond. B
Diodes = Method 1038 Cond. A
SCR's = Method 1040
FINAL ELECTRICAL PARAMETER (DC-100%)
HERMETIC SEAL(FINE & GROSS LEAK) for Cavity Devices (Method 1071)
Group A(Static Parameters @25°C)
Group B Solderability Without Aging (Method 2026)
Group B Resistance to Solvents (Method 1022)
Semitronics Logo
Corporate Headquarters

64 Commercial Street
Freeport, NY 11520
Phone: 516-623-9400
Fax: 516-223-6266

© Semitronics Corporation. All rights reserved. Maintainance and support by Joomla Connections, LLC.

top